The compact system for spectrum characterization and short wavelength beam profile relates to the characterization of electromagnetic radiation bundles in the spectrum of the spectrum from vacuum ultraviolet (VUV) to X-rays, ie in the wavelength ranges from the order of tens of nm (RTG) to hundreds of nm (VUV). Using the proposed device, it is possible to determine the intensity profile of the characteristic beam and its spectrum.
Technical date![]() Simple utility of the device, which is very practical and easy to use Compact design option (all fit into 300mm length DN 100) Especially suited for VUV rays of soft X-ray radiation found in many research and university laboratories (HHG, plasma based X-ray lasers, synchrotrons, FELs) |
Contact
Oskar Lazansky | e-mail: oskar.lazansky@eli-beams.eu | mobile: +420 725 015 339