LIDT – Laser Induced Damage Threshold

The LIDT station is used for the determination of threshold damage of optical components induced by ultrafast laser pulses. The damages are verified offline by Nomarski microscopy and the setup can be situated in high vacuum. All the components are optimized for low outgassing.

Technical data

800 nm
130 fs, single shot to 1 kHz, <2 mJ
45 fs, single shot to 10 Hz <0.9 J
50 fs, single shot to 1 kHz <0.8 mJ
~15 fs, 1 kHz few mJ

1060 nm (tunable)
80 – 130 fs, single shot to 1 kHz, <0.3 mJ

1030 nm
1.5 ps, 1 kHz, <30 mJ

515 nm
1.5 ps, 1 kHz, <15 mJ

R-on-1, S-on-1 or Raster Scan method in high vacuum or in air


Ultrashort laser pulses with high power enable to achieve higher accuracy of results

High repetition rate allows testing of the effects of ageing and long-term stress

Already tested and in use at ELI Beamlines, the Czech Republic


Mrs. Miroslava Pribisova |  e-mail: | mobile: +420 601 386 148
Mr. Oskar Lazansky |  e-mail: | mobile: +420 725 015 339




Comments are closed